SECTION I TM 1-6625-3081-30P
9
MWO 1-6625-3081-55-6 (cont)
program (OIP) system
changes
MWO 1-6625-3081-55-7
Modification of elec-
Normal
12 Sep 91
11 Sep 95
trical/optical test
bench and nightside
test bench (NSTB)
assembly. (Installa-
tion of MINCO probe)
MWO 1-6625-3081-55-9
Modification of DCTB
Normal
1 Feb 93
1 Feb 97
optics mounting support
assembly to properly
mount and test TADS
laser receiver unit
MWO 1-6625-3081-55-10
Modification of TADS
Routine
01 Jul 93
01 Jul 97
PGSE test program set
(TPS) C/N 3 circuit card
assembly (CCA) A-40
(NSN 5998-01-333-2976)
(EIC TAD) (TPS hardware)
MWO 1-6625-3081-55-11
Modification of PNVS
Routine
17 Sep 93
17 Sep 97
night sensor assembly
TPS C/N 2 branched-
electrical special
purpose cable assembly
(NSN 5995-01-276-5473)
(EIC TAD)
MWO 1-6625-3081-55-12
Modification of TADS
Routine
30 Mar 98
30 Mar 03
PGSE optical signal
Generator (OSG),input-
Output console 2A2
(EIC TAD)
d.
FABRICATION INSTRUCTIONS. Part numbers for bulk materials are referenced in the
description column of the line item entry for the item to be manufactured/ fabricated. Detailed
fabrication instructions for items source coded to be manufactured or fabricated are found in
TM 1-6625-3081-23 series.
e. ASSEMBLY INSTRUCTIONS. Detailed assembly instructions for items source coded to be
assembled from component spare/repair parts are found i TM 1-6625-3081-23 series. Items that make up
the assembly are listed immediately following the assembly item entry or reference is made to an applicable
figure.
f.
KITS. Not applicable.
g.
INDEX NUMBERS. Not applicable.
